Registration form please return this form by March 30, 2006 ▼ exmatec´06 viajes melkart, S. L. L avda. Ana de viya, 19



Descargar 140,68 Kb.
Fecha de conversión10.04.2017
Tamaño140,68 Kb.
EXMATEC´06
REGISTRATION FORM

Please return this form by March 30, 2006 ▼ EXMATEC´06



VIAJES MELKART, S. L. L

AVDA. ANA DE VIYA, 19

11009 CÁDIZ

SPAIN

Name:…………………………………………………….….


First name:…………………………………….…………….
Title:………………………………………………………….
Address:…………………………………………………….
……………………………………………………………………

……………………………………………………………………


Postcode:…………………………City:………………………...
Country:………………………………………………………….
Phone:……………………………………………………………
Fax:……………………………………………………………….
E-mail:……………………………………………………………

Platform presentation(s).…………………………………….…

(pendrive/CD or transparencies)
Vegetarian (yes or not)…………………………………………
*I will attend the EXMATEC´06
*I will be accompanied by……….……person (s).
*I enclose the abstract(s) of my presentation(s).

GENERAL INFORMATION




Location and date

The 8th International Workshop on Expert Evaluation & Control of Compound Semiconductor Materials & Tecnologies will be held at the Congress Centre in Cádiz, located in the ancient tobacco factory, form 14 to 17 May, 2006.

Weather: Middle May in Cádiz the weather is comfortable, averaging 20-25ºC.

Registration and Technical Secretary

For all correspondence

EXMATEC´06

VIAJES MELKART, S.L.L

AVDA. ANA DE VIYA, 19

11009 CÁDIZ

Telephone: (34) 956 263 633 – Fax: (34) 956 261 035

E-mail: exmatec06@uca.es




Registration fees



Before March 30 After March 30
Full Registration fee EUR 420 EUR 500

Student registration fee EUR 350 EUR 420

Accompanying persons EUR 150 EUR 150

The participants fees include: the booklet of abstracts, the welcome reception, the dinner and the pre-dinner excursion.
The accompanying person fees include: the welcome reception and the tour on Sunday the 14th, excursion and the dinner on Tuesday the 16th.

but don ´t include the access to the working sessions.


Language


English is the official language of the Conference.

Accommodation

We will propose three and four stars hotels located in the city centre.



First Announcement & Call for Papers

EXMATEC’06


2006

8TH International Workshop on


Expert Evaluation & Control of Compound
Semiconductor Materials & Technologies

Cádiz, Spain

May 15- 17, 2006




Organized by
Grupo de Investigación de Ciencias e Ingeniería de Materiales

Universidad de Cádiz - SPAIN


AND
Groupe d'Etudes de Métallurgie Physique et Physique des Matériaux (GEMPPM)

INSA-Lyon - FRANCE



ABOUT EXMATEC´06
Contributions fall within the scope of EXMATEC as long as they treat issues of material fabrication, characterization and processing of SEMICONDUCTOR MATERIALS. Works on DEVICES are also appropriate in this context. The central topics are development, improvement and application of new and advanced methods in the fabrication and evaluation of compound semiconductor materials and structures to develop understanding of the interrelationships between structural, electrical and other material properties and device characteristics, such as performance, reliability, reproducibility, lifetime, yield, etc.

The conference topics apply to all compound semiconductor materials, related structures and processing steps.


Appropriate topics include, but are not necessarily limited to the following:
Substrates, bulk and surface properties, annealing, post growth treatment, growth control and assessment
■. Epi-layers, ion implantation, wafer bonding, band gap

engineering, growth control and assessment, role of

buffer layers, selective deposition, hydrogenation, etc.
■. Control of interfaces, surface structure, substrate pre-

processing, vertical structures, lattice mismatch.


■. Narrow and intermediate gap III-V, II-VI based

compound materials and devices.


■. Wide gap IV-IV, III-V and II-VI, Si-Ge and similar materials and devices.
■. Quantum dots, low dimensional structures, other nanostructures.
■. Fabrication, modelling and evaluation of compound microelectronic mechanisms.
■. Reliability, physics of failure and characterization of degradation mechanisms.
■. Monitoring, characterization, use of statistical process control techniques.
■. Process, epitaxy, issues, intermediate products and fully processed devices.
■. Instrumentation, standardization, innovative and improved characterization techniques.

CHAIRMAN OF THE WORKSHOP
DANIEL ARAUJO

University of Cadiz

Telephone: 00 (34) 956 016 351 / 956 016 335

Fax: 00 (34) 956 016 288

E-mail: daniel.araujo@uca.es

INTERNATIONAL STEERING COMMITTEE


S. Krawczyk

(France, Chairman)

J. Camassel

(France)

R. T. Blunt

(United Kingdom)

J. Deen

(Canada)

K. Somogy

(Hungary)

H. L. Hartnagel

(Germany)

H. Hasegawa

(Japan)

M. Baeumler

(Germany)

D. Lile

(USA)

S. Mahajan

(USA)

S. Miyazawa

(Japan)

M. Ozeki

(Japan)

D. Pavlidis

(USA/Germany)

R. Triboulet

(France)

J. Weyher

(The Netherlands and Poland)

LOCAL ORGANISING COMMITTEE
D. ARAUJO (INSA-LYON, France)

S. MOLINA (University of Cadiz, Spain)

D. GONZALEZ (University of Cadiz, Spain)

A. SANCHEZ (University of Cadiz, Spain)

M. GUTIERREZ (University of Cadiz, Spain)

D. SALES (University of Cadiz, Spain)

A. CORDON (Viajes Melkart)

INTERNATIONAL SCEINTIFIC COMITEE (to be confirmed)


R. Blunt

(United Kingdom)

M. Hopkinson

(United Kingdom)

G. Salviati

(Italy)

C. Frigeri

(Italy)

J. Gyulai

(Hungary)

D. Araujo

(France)

M. Heuken

(Germany)

K. Hirose

(Japan)

J. Jimenez

(Spain)

M. R. Leys

(Belgium)

D. C. Look

(USA)

J. Novák

(Slovakia)

Y. Otoki

(Japan)

S. Pearton

(USA)

B. Põdör

(Hungary)

E. Rao

(France)

Y. Zhilyaev

(Russia)


IMPORTANT DEADLINES
Abstract submission 15 February 2006

Notification of acceptance of abstracts 15 March 2006



Early registration 30 March 2006

Cancellation 15 April 2006


La base de datos está protegida por derechos de autor ©absta.info 2016
enviar mensaje

    Página principal